1994, ISBN: 0306447029

[EAN: 9780306447020], Gebraucht, guter Zustand, [PU: Plenum Press], FRACTAL SURFACE DIMENSION GEOMETRY STICKING PROBABILITY POINCARE SECTION BOUNDARY LINE STRIDE LENGTH IMAGE PROCESSING O… Mehr…

[EAN: 9780306447020], Gebraucht, guter Zustand, [PU: Plenum Press], FRACTAL SURFACE DIMENSION GEOMETRY STICKING PROBABILITY POINCARE SECTION BOUNDARY LINE STRIDE LENGTH IMAGE PROCESSING OPERATION PERIMETER RANGE CHAIN CODE FOURIER ANALYSIS POWER SPECTRUM SPECULAR REFLECTION ELEVATION DATA MODELLING MACHINE DIRECTION BRITTLE FRACTURE FLAT SCIENCE CHEMISTRY ANALYTIC PHYSICAL THEORETICAL PHYSICS CONDENSED MATTER CRYSTALLOGRAPHY SPECTROSCOPY TECHNOLOGY ENGINEERING MATERIALS ANISOTROPIC SURFACES APPLIED ARRAY BRIGHTNESS PATTERNS BROWNIAN MOTION CANTOR DUST CLUSTER CORRELATION CORRESPONDS CURVE DEPOSITION DESCRIBED DIFFUSION LIMITED AGGREGATION DIMENSIONAL DISTANCE DISTRIBUTION PROFILES VALUES EUCLIDEAN EXTRUSION TRANSFORM PROFILE FUNCTION GAUSSIAN GRID HORIZONTAL HURST PLOT INTERCEPT ISLANDS ISOTROPIC ITERATION KAYE KORCAK L SYSTEM LINEAR LOG FREQUENCY MAGNITUDE MANDELBROT MEASUREMENT METHODS MENGER SPONGE MICROSCOPE MIDPOINT DISPLACEMENT MINKOWSKI NOISE OPTION KEY PARAMETERS PARTICLES PHASE PIXELS PLANE OF SLOPE PROFILOMETER RANDOM NUMBER RELATIONSHIP RESOLUTION RICHARDSON ROSE RUSS SCANNING SCATTERING SELF AFFINE SPACE STRAIGHT STRUCTURE IMAGES ROUGHNESS TECHNIQUE TEXTURE THRESHOLDING TOOL VARIATION VARY VERTICAL WIDTH, Hardcover, x + 309 pages + two 3.5" diskettes in back pocket, numerous b&w illustrations in text. Ex-foreign university library, marked "ausgesondert"; ownership & catalogue markings on the reverse of title page and inside the front board (covered with a blank sticker). Missing the front blank endpaper (torn out); a small edge-nick to the bottom of title page; a gentle crease in lower inner corners of pages. Interior is clean, bright, untanned, with unmarked text, securely bound. Shelfworn boards show scuffing to edges, rubbed tips of outer corners, a touch of sunning. Issued without a dust jacket. -- The author integrates discussions of fractal geometry, surface modeling techniques, and applications to real world problems to provide a comprehensive, accessible overview of the field. His work will equip researchers with the basic tools for measurement and interpretation of data, stimulating more work on these problems and, perhaps, leading to an understanding of the reasons that Nature has adopted this geometry to shape much of our world. -- Contents: 1. Introduction [A Little History; Classes of Fractal Surfaces; Monster Curves; Random Fractals; Dusts; Zerosets; Korcak Islands; Deposited Surfaces; Pore Structures; L-Systems]; 2. Measuring the Fractal Dimension of Boundary Lines [Richardson Plots; Using a Computer; Digitized Images; Mosaic Amalgamation and the Kolmogorov Dimension; Minkowski Sausage; Implementation with the Euclidean Distance Transform; Fitting Lines to Data; Other Methods; Comparison of Dimensions]; 3. The Relationship between Boundary Lines and Surfaces [Analogies; Direct Methods; Zerosets; Dimensional Analysis; Minkowski Comforter; Data Formats; Effects of Noise; Simulated Noise]; 4. Hurst and Fourier Analysis [Time-Based Data; Hurst Plot; Fractal Brownian Motion; Elevation Profiles; Hurst Analysis of Range Images; Hurst Orientation Transform; Fourier Analysis; Fourier Analysis of Boundary Lines; White and 1/f Noise; Fourier Analysis in Two Dimensions; Anisotropy; Characterizing the Magnitude of the Roughness; Topothesy]; 5. Light Reflection and Scattering [Visual Appearance; Fractal Brownian Profiles; Electrons, Radar, etc.; Local Texture Measurement; Brightness Patterns from Rough Surfaces; Relating the Surface and Brightness Dimensions; Light Scattering; Scattering of Diffuse Light from Rough Surfaces; Range Measurement Methods; Range Images and Surface Parameters]; 6. Modeling Fractal Profiles and Surfaces [Fractal Profiles; Particle Aggregation; Deposited Surfaces; Modeling a Fractal Surface; Fractal Brownian Surfaces; Mandelbrot-Weierstrass Functions; Comparing Models and Measurements; Takagi Functions; Weak and Strong Anisotropy; Modeling an Anisotropic Surface]; 7. Mixed Fractals [Limited Self-Similarity; Kaye's Definition; Simulating the Projection; Vicsek's Fat Fractal; Mixed Fractals; Mandelbrot Conjectures; Measurement of Fractal Dimensions; Addition of Fractals; Variation with Scale; Splicing Fractals Together; Directionality; Tentative Conclusions]; 8. Examples of Fractal Surfaces [Brittle Fracture; Machining and Wear; Deposited Surfaces; Pore Networks; Other Surface Applications; Very Flat Surfaces I: Interferometry; Very Flat Surfaces II: Atomic Force Microscopy]; References; Appendix; Index, Books<

1994, ISBN: 0306447029

Fractal Surfaces. von Russ, John C. Russ, John C. Gepflegter, sauberer Zustand.1994. Aus der Auflösung einer renommierten Bibliothek. Kann Stempel beinhalten. EUR 173,74. Unser Preis. Fra… Mehr…

Fractal Surfaces. von Russ, John C. Russ, John C. Gepflegter, sauberer Zustand.1994. Aus der Auflösung einer renommierten Bibliothek. Kann Stempel beinhalten. EUR 173,74. Unser Preis. Fractal Surfaces von Russ, John C.:Autor(en) Russ, John C.:Auflage 1994Verlag / Jahr Springer US, 1994.Sprache DeutschISBN 0306447029EAN 9780306447020Bestell-Nr 1366212202Bemerkungen Gepflegter, sauberer Zustand.1994. Aus der Auflösung einer renommierten Bibliothek. Kann Stempel beinhalten. 1366212/202Schlagworte modeling,scattering,geometry,Unser Preis EUR 173,74Versandkostenfrei innerhalb DeutschlandsAufgenommen mit whBOOKSicheres Bestellen - Order-Control geprüft!Artikel eingestellt mit dem w+h GmbH eBay-Service Daten und Bilder powered by Buchfreund (2023-07-11), Sehr gut, Festpreisangebot, [LT: FixedPrice], Bestes Angebot, [LT: BestOffer], Buchtitel: Fractal Surfaces, Sprache: Deutsch, Genre: Varia, Produktart: Bücher, EAN: 9780306447020, Springer US, 1994<

1994, ISBN: 0306447029

[EAN: 9780306447020], Tweedehands, goed, [SC: 49.95], [PU: Springer US], MODELING,SCATTERING,GEOMETRY,, Gepflegter, sauberer Zustand.1994. Aus der Auflösung einer renommierten Bibliothek.… Mehr…

[EAN: 9780306447020], Tweedehands, goed, [SC: 49.95], [PU: Springer US], MODELING,SCATTERING,GEOMETRY,, Gepflegter, sauberer Zustand.1994. Aus der Auflösung einer renommierten Bibliothek. Kann Stempel beinhalten. 1366212/202, Books<

1994, ISBN: 0306447029

[EAN: 9780306447020], Gebraucht, guter Zustand, [PU: Plenum Press], Buy with confidence! Book is in good condition with minor wear to the pages, binding, and minor marks within, Books