. .
Deutsch
Deutschland
Ähnliche Bücher
Weitere, andere Bücher, die diesem Buch sehr ähnlich sein könnten:
Suchtools
Anmelden

Anmelden mit Facebook:

Registrieren
Passwort vergessen?


Such-Historie
Merkliste
Links zu eurobuch.de

Dieses Buch teilen auf…
Buchtipps
Aktuelles
Tipp von eurobuch.de
Werbung
Bezahlte Anzeige
FILTER
- 0 Ergebnisse
Kleinster Preis: 123,27 €, größter Preis: 162,38 €, Mittelwert: 138,76 €
Noncontact Atomic Force Microscopy 03 - Seizo Morita
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
(*)
Seizo Morita:

Noncontact Atomic Force Microscopy 03 - gebunden oder broschiert

2009, ISBN: 9783319155876

ID: 9783319155876

Volume 3 This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology. Noncontact Atomic Force Microscopy 03: This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology. Mikroskopie Nanotechnologie Technologie / Nanotechnologie Spektroskopie SCIENCE / Nanoscience, Springer-Verlag Gmbh

Neues Buch Rheinberg-Buch.de
Buch, Englisch, Neuware Versandkosten:Ab 20¤ Versandkostenfrei in Deutschland, Sofort lieferbar, DE. (EUR 0.00)
Details...
(*) Derzeit vergriffen bedeutet, dass dieser Titel momentan auf keiner der angeschlossenen Plattform verfügbar ist.
Noncontact Atomic Force Microscopy 03 - Herausgegeben von Morita, Seizo Giessibl, Franz J. Meyer, Ernst Wiesendanger, Roland
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
(*)

Herausgegeben von Morita, Seizo Giessibl, Franz J. Meyer, Ernst Wiesendanger, Roland:

Noncontact Atomic Force Microscopy 03 - gebunden oder broschiert

2015, ISBN: 9783319155876

[ED: Hardcover], [PU: Springer, Berlin Springer International Publishing], This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology. 2015. 2015. xxii, 527 S. 97 SW-Abb., 159 Farbabb. 235 mm Sofort lieferbar, [SC: 0.00], Neuware, gewerbliches Angebot

Neues Buch Booklooker.de
buecher.de GmbH & Co. KG
Versandkosten:Versandkostenfrei, Versand nach Deutschland (EUR 0.00)
Details...
(*) Derzeit vergriffen bedeutet, dass dieser Titel momentan auf keiner der angeschlossenen Plattform verfügbar ist.
Noncontact Atomic Force Microscopy 03 - Springer
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
(*)
Springer:
Noncontact Atomic Force Microscopy 03 - neues Buch

2015

ISBN: 9783319155876

ID: 677599207

This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology. Volume 3 Bücher > Fremdsprachige Bücher > Englische Bücher gebundene Ausgabe 02.06.2015 Buch (fremdspr.), Springer, .201

Neues Buch Buch.ch
No. 41552874 Versandkosten:zzgl. Versandkosten
Details...
(*) Derzeit vergriffen bedeutet, dass dieser Titel momentan auf keiner der angeschlossenen Plattform verfügbar ist.
Noncontact Atomic Force Microscopy 03 - Springer
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
(*)
Springer:
Noncontact Atomic Force Microscopy 03 - neues Buch

2009, ISBN: 9783319155876

ID: 749653896

This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology. Volume 3 Buch (fremdspr.) Bücher>Fremdsprachige Bücher>Englische Bücher, Springer

Neues Buch Thalia.de
No. 41552874 Versandkosten:, Sofort lieferbar, DE (EUR 0.00)
Details...
(*) Derzeit vergriffen bedeutet, dass dieser Titel momentan auf keiner der angeschlossenen Plattform verfügbar ist.
Noncontact Atomic Force Microscopy: Volume 3 - Morita, Seizo (EDT)/ Giessibl, Franz J. (EDT)/ Meyer, Ernst (EDT)/ Wiesendanger, Roland (EDT)
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
(*)
Morita, Seizo (EDT)/ Giessibl, Franz J. (EDT)/ Meyer, Ernst (EDT)/ Wiesendanger, Roland (EDT):
Noncontact Atomic Force Microscopy: Volume 3 - gebunden oder broschiert

ISBN: 9783319155876

ID: 9783319155876

hardback

Neues Buch Blackwell.co.uk
Blackwells.co.uk
in stock Versandkosten:Usually dispatched within 72 hours (EUR 2.88)
Details...
(*) Derzeit vergriffen bedeutet, dass dieser Titel momentan auf keiner der angeschlossenen Plattform verfügbar ist.

< zum Suchergebnis...
Details zum Buch
Noncontact Atomic Force Microscopy 03
Autor:

Seizo Morita

Titel:

Noncontact Atomic Force Microscopy 03

ISBN-Nummer:

9783319155876

This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.

Detailangaben zum Buch - Noncontact Atomic Force Microscopy 03


EAN (ISBN-13): 9783319155876
ISBN (ISBN-10): 3319155873
Gebundene Ausgabe
Erscheinungsjahr: 2009
Herausgeber: Springer-Verlag Gmbh

Buch in der Datenbank seit 07.08.2015 14:52:55
Buch zuletzt gefunden am 03.01.2017 15:43:01
ISBN/EAN: 9783319155876

ISBN - alternative Schreibweisen:
3-319-15587-3, 978-3-319-15587-6

< zum Suchergebnis...
< zum Archiv...
Benachbarte Bücher