Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49, Band 49) - gebunden oder broschiert
2012, ISBN: 9783642273803
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Auger- And X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - gebunden oder broschiert
2012, ISBN: 9783642273803
Hard cover, New., Sewn binding. Cloth over boards. 528 p. Contains: Unspecified. Springer Surface Sciences, 49., Berlin, Heidelberg, [PU: Springer]
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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49) - gebunden oder broschiert
2012, ISBN: 3642273807
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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - gebunden oder broschiert
2012, ISBN: 3642273807
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Auger- and X-ray Photoelectron Spectroscopy in Materials Science: A User-oriented Guide - gebunden oder broschiert
2013, ISBN: 9783642273803
Springer Verlag, 2012. Hardcover. New. 2013 edition. 547 pages. 9.25x6.00x1.00 inches., Springer Verlag, 2012, 6
Biblio.co.uk |
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49, Band 49) - gebunden oder broschiert
2012, ISBN: 9783642273803
Springer, Gebundene Ausgabe, Auflage: 2013, 548 Seiten, Publiziert: 2012-10-25T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 20.72 kg, Maschinenbau, Ingenieurwissenschaften, … Mehr…
Hofmann, Siegfried:
Auger- And X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - gebunden oder broschiert2012, ISBN: 9783642273803
Hard cover, New., Sewn binding. Cloth over boards. 528 p. Contains: Unspecified. Springer Surface Sciences, 49., Berlin, Heidelberg, [PU: Springer]
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49) - gebunden oder broschiert
2012
ISBN: 3642273807
[EAN: 9783642273803], Neubuch, [PU: Springer], Clean and crisp and new!, Books
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - gebunden oder broschiert
2012, ISBN: 3642273807
[EAN: 9783642273803], Gebraucht, wie neu, [PU: Springer 2012-10-25], Item is in new condition., Books
Auger- and X-ray Photoelectron Spectroscopy in Materials Science: A User-oriented Guide - gebunden oder broschiert
2013, ISBN: 9783642273803
Springer Verlag, 2012. Hardcover. New. 2013 edition. 547 pages. 9.25x6.00x1.00 inches., Springer Verlag, 2012, 6
Bibliographische Daten des bestpassenden Buches
Autor: | |
Titel: | |
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To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Detailangaben zum Buch - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49, Band 49)
EAN (ISBN-13): 9783642273803
ISBN (ISBN-10): 3642273807
Gebundene Ausgabe
Erscheinungsjahr: 2012
Herausgeber: Springer
528 Seiten
Gewicht: 0,939 kg
Sprache: Englisch
Buch in der Datenbank seit 2007-06-19T21:28:18+02:00 (Berlin)
Detailseite zuletzt geändert am 2023-08-09T18:04:24+02:00 (Berlin)
ISBN/EAN: 9783642273803
ISBN - alternative Schreibweisen:
3-642-27380-7, 978-3-642-27380-3
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: hofman, siegfried hofmann, hofmann else, siegfried springer
Titel des Buches: before science, material sciences, materials sciences, surface science series, user guide, ray spectroscopy
Daten vom Verlag:
Autor/in: Siegfried Hofmann
Titel: Springer Series in Surface Sciences; Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - A User-Oriented Guide
Verlag: Springer; Springer Berlin
528 Seiten
Erscheinungsjahr: 2012-10-25
Berlin; Heidelberg; DE
Gedruckt / Hergestellt in Niederlande.
Sprache: Englisch
320,99 € (DE)
329,99 € (AT)
354,00 CHF (CH)
POD
XX, 528 p.
BB; Hardcover, Softcover / Physik, Astronomie/Atomphysik, Kernphysik; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Verstehen; Auger electron spectroscopy; interface analysis; scanning Auger microscopy; surface analysis; thin-film depth profiling; Condensed Matter Physics; Spectroscopy; Surfaces, Interfaces and Thin Film; Spektroskopie, Spektrochemie, Massenspektrometrie; Materialwissenschaft; BC
Outline of the Technique/Brief Description.- Theoretical Background.- Instrumentation.- Practical Surface Analysis with AES.- Data Evaluation/Quantification.- Problem Solving with AES (Examples).This is the most comprehensive book available on this widely used analytical technique Includes supplementary material: sn.pub/extras
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