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Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - Brent Fultz, James M. Howe
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
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Brent Fultz, James M. Howe:

Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - gebunden oder broschiert

ISBN: 3642297609

[SR: 1787583], Hardcover, [EAN: 9783642297601], Springer, Springer, Book, [PU: Springer], Springer, This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises., 52183011, Testing, 226704, Materials & Material Science, 173515, Engineering, 173507, Engineering & Transportation, 1000, Subjects, 283155, Books, 13570, Chemistry, 16052551, Alkaloids, 13571, Analytic, 13511, Biochemistry, 16052341, Chemical Physics, 16052451, Chromatography, 13575, Clinical, 13577, Crystallography, 13579, General & Reference, 226694, Geochemistry, 13590, Industrial & Technical, 13581, Inorganic, 16052621, Molecular Chemistry, 16052651, Nuclear Chemistry, 13585, Organic, 16052661, Photochemistry, 13588, Physical & Theoretical, 16052541, Polymers & Macromolecules, 16052401, Safety, 75, Science & Math, 1000, Subjects, 283155, Books, 13839, Electron Microscopes & Microscopy, 13837, Experiments, Instruments & Measurement, 75, Science & Math, 1000, Subjects, 283155, Books, 226697, Electromagnetism, 16052201, Electricity, 16052241, Magnetism, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 14585, Solid-State Physics, 13731, Superconductivity, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 491732, Physics, 468216, Science & Mathematics, 465600, New, Used & Rental Textbooks, 2349030011, Specialty Boutique, 283155, Books

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Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - Brent Fultz, James M. Howe
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Brent Fultz, James M. Howe:

Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - gebunden oder broschiert

ISBN: 3642297609

[SR: 1787583], Hardcover, [EAN: 9783642297601], Springer, Springer, Book, [PU: Springer], Springer, This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises., 52183011, Testing, 226704, Materials & Material Science, 173515, Engineering, 173507, Engineering & Transportation, 1000, Subjects, 283155, Books, 13570, Chemistry, 16052551, Alkaloids, 13571, Analytic, 13511, Biochemistry, 16052341, Chemical Physics, 16052451, Chromatography, 13575, Clinical, 13577, Crystallography, 13579, General & Reference, 226694, Geochemistry, 13590, Industrial & Technical, 13581, Inorganic, 16052621, Molecular Chemistry, 16052651, Nuclear Chemistry, 13585, Organic, 16052661, Photochemistry, 13588, Physical & Theoretical, 16052541, Polymers & Macromolecules, 16052401, Safety, 75, Science & Math, 1000, Subjects, 283155, Books, 13839, Electron Microscopes & Microscopy, 13837, Experiments, Instruments & Measurement, 75, Science & Math, 1000, Subjects, 283155, Books, 226697, Electromagnetism, 16052201, Electricity, 16052241, Magnetism, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 14585, Solid-State Physics, 13731, Superconductivity, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 491732, Physics, 468216, Science & Mathematics, 465600, New, Used & Rental Textbooks, 2349030011, Specialty Boutique, 283155, Books

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Transmission Electron Microscopy and Diffractometry of Materials - neues Buch

2012

ISBN: 9783642297601

[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises., [SC: 1.50], Neuware, gewerbliches Angebot, 245x165x51 mm, [GW: 1334g]

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Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - gebunden oder broschiert

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ID: 615217306

Springer, 2012-10-14. 4th ed. 2013. Hardcover. Very Good. Buy with confidence. Excellent Customer Service & Return policy. Ships Fast. Expedite Shipping Available., Springer, 2012-10-14

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Fultz, Brent; Howe, James:
Transmission Electron Microscopy and Diffractometry of Materials - gebunden oder broschiert

2012, ISBN: 3642297609

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4th edition Gebundene Ausgabe Elektronenmikroskopie - Raster-Tunnel-Mikroskopie, Raster-Tunnel-Mikroskopie ( Elektronenmikroskopie ), Spektroskopie, mit Schutzumschlag neu, [PU:Springer-Verlag GmbH]

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Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)
Autor:

Brent Fultz, James Howe

Titel:

Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)

ISBN-Nummer:

9783642297601

Detailangaben zum Buch - Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)


EAN (ISBN-13): 9783642297601
ISBN (ISBN-10): 3642297609
Gebundene Ausgabe
Erscheinungsjahr: 2012
Herausgeber: Springer-Verlag GmbH
761 Seiten
Gewicht: 1,318 kg
Sprache: Englisch

Buch in der Datenbank seit 07.04.2009 22:49:51
Buch zuletzt gefunden am 10.11.2016 21:49:30
ISBN/EAN: 9783642297601

ISBN - alternative Schreibweisen:
3-642-29760-9, 978-3-642-29760-1

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