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[EAN: 9783662519769], Neubuch, [SC: 0.0], [PU: Springer Berlin Heidelberg], IN-SITUCHARACTERIZATION; MATERIALDYNAMICS; NANOANALYSIS; NANOSCALEMATERIALS; NEUTRONSCATTERING; PHOTOELECTRONSP… Mehr…
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2016, ISBN: 9783662519769
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2016, ISBN: 9783662519769
Springer Verlag, 2016. Paperback. New. reprint edition. 268 pages. 9.25x6.10x0.63 inches., Springer Verlag, 2016, 6
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2016, ISBN: 9783662519769
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Alexander Ziegler:
In-situ Materials Characterization : Across Spatial and Temporal Scales - Taschenbuch2016, ISBN: 3662519763
[EAN: 9783662519769], Neubuch, [SC: 0.0], [PU: Springer Berlin Heidelberg], IN-SITUCHARACTERIZATION; MATERIALDYNAMICS; NANOANALYSIS; NANOSCALEMATERIALS; NEUTRONSCATTERING; PHOTOELECTRONSP… Mehr…
2023
ISBN: 9783662519769
[ED: Taschenbuch], [PU: Springer Berlin Heidelberg], Neuware - The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because t… Mehr…
2016, ISBN: 9783662519769
Taschenbuch
[ED: Kartoniert / Broschiert], [PU: Springer Berlin Heidelberg], Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Scientific status report … Mehr…
2016, ISBN: 9783662519769
Springer Verlag, 2016. Paperback. New. reprint edition. 268 pages. 9.25x6.10x0.63 inches., Springer Verlag, 2016, 6
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Detailangaben zum Buch - In-situ Materials Characterization
EAN (ISBN-13): 9783662519769
ISBN (ISBN-10): 3662519763
Gebundene Ausgabe
Taschenbuch
Erscheinungsjahr: 2016
Herausgeber: Springer Berlin
Buch in der Datenbank seit 2016-09-10T14:43:34+02:00 (Berlin)
Detailseite zuletzt geändert am 2024-01-11T21:28:42+01:00 (Berlin)
ISBN/EAN: 9783662519769
ISBN - alternative Schreibweisen:
3-662-51976-3, 978-3-662-51976-9
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: alexander ziegler, graaf, zhang xiao, zhang feng, joost, alexander heinz
Titel des Buches: characterization materials, scales, situ
Daten vom Verlag:
Autor/in: Alexander Ziegler; Heinz Graafsma; Xiao Feng Zhang; Joost W.M. Frenken
Titel: Springer Series in Materials Science; In-situ Materials Characterization - Across Spatial and Temporal Scales
Verlag: Springer; Springer Berlin
256 Seiten
Erscheinungsjahr: 2016-08-23
Berlin; Heidelberg; DE
Gedruckt / Hergestellt in Niederlande.
Sprache: Englisch
106,99 € (DE)
109,99 € (AT)
118,00 CHF (CH)
POD
XI, 256 p. 124 illus., 78 illus. in color.
BC; Hardcover, Softcover / Physik, Astronomie/Atomphysik, Kernphysik; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Verstehen; In-situ characterization; Material dynamics; Nanoanalysis; Nanoscale materials; Neutron scattering; Photoelectron spectroscopy; Scanning probe techniques; Structure-property; Ultra-fast analysis; X-ray absorption spectroscopy; Nanophysics; Characterization and Analytical Technique; Spectroscopy; Surfaces, Interfaces and Thin Film; Nanotechnology; Structural Materials; Nanowissenschaften; Werkstoffprüfung; Spektroskopie, Spektrochemie, Massenspektrometrie; Materialwissenschaft; Nanotechnologie; BB
The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes, and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical, and x-ray microscopies (e.g., scanning, transmission, and low-energy electron microscopy, and scanning probe microscopy), or in the scattering realm with x-ray, neutron and electron diffraction.Scientific status report on analytical techniques in nano-and surface sciences Presentation of the basics and applications of various surface and thin film analytical -techniques: Scanning Probe Microscopy, X-ray diffraction at synchrotron, Free-Electron-Laser sources, Ultra-fast TEM and Electron Diffraction, FIB/SEM, X-ray photoelectron spectroscopy Presentation of advanced techniques for bulk analysis: X-ray absorption spectroscopy, Time-Resolved Neutron Scattering Includes supplementary material: sn.pub/extras
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