Noncontact Atomic Force Microscopy | Volume 3 | Seizo Morita (u. a.) | Buch | NanoScience and Technology | HC runder Rücken kaschiert | Englisch | 2015 | Springer International Publishing - gebunden oder broschiert
2015, ISBN: 9783319155876
[ED: Gebunden], [PU: Springer International Publishing], This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding function… Mehr…
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Noncontact Atomic Force Microscopy / Volume 3 / Seizo Morita (u. a.) / Buch / NanoScience and Technology / HC runder Rücken kaschiert / Englisch / 2015 / Springer International Publishing - gebunden oder broschiert
2015, ISBN: 9783319155876
[ED: Gebunden], [PU: Springer International Publishing], This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding function… Mehr…
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2015, ISBN: 3319155873
2015 Gebundene Ausgabe Mikroskopie, Nanotechnologie, Technologie / Nanotechnologie, Spektroskopie, Nanowissenschaften, Spektroskopie, Spektrochemie, Massenspektrometrie, Materialwissens… Mehr…
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Noncontact Atomic Force Microscopy | Volume 3 | Seizo Morita (u. a.) | Buch | NanoScience and Technology | HC runder Rücken kaschiert | Englisch | 2015 | Springer International Publishing - gebunden oder broschiert
2015, ISBN: 9783319155876
[ED: Gebunden], [PU: Springer International Publishing], This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding function… Mehr…
2002, ISBN: 9783319155876
[ED: Buch], [PU: Springer International Publishing], Neuware - This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding fu… Mehr…
2015
ISBN: 9783319155876
Volume 3, Buch, Hardcover, 2015, This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that … Mehr…
Noncontact Atomic Force Microscopy / Volume 3 / Seizo Morita (u. a.) / Buch / NanoScience and Technology / HC runder Rücken kaschiert / Englisch / 2015 / Springer International Publishing - gebunden oder broschiert
2015, ISBN: 9783319155876
[ED: Gebunden], [PU: Springer International Publishing], This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding function… Mehr…
2015, ISBN: 3319155873
2015 Gebundene Ausgabe Mikroskopie, Nanotechnologie, Technologie / Nanotechnologie, Spektroskopie, Nanowissenschaften, Spektroskopie, Spektrochemie, Massenspektrometrie, Materialwissens… Mehr…
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This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.
Detailangaben zum Buch - Noncontact Atomic Force Microscopy
EAN (ISBN-13): 9783319155876
ISBN (ISBN-10): 3319155873
Gebundene Ausgabe
Erscheinungsjahr: 2009
Herausgeber: Springer International Publishing
Buch in der Datenbank seit 2015-08-07T14:52:55+02:00 (Berlin)
Detailseite zuletzt geändert am 2023-04-11T17:48:58+02:00 (Berlin)
ISBN/EAN: 9783319155876
ISBN - alternative Schreibweisen:
3-319-15587-3, 978-3-319-15587-6
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: ernst meyer, gies, ernst wies, roland wiesendanger, meyer franz, morita
Titel des Buches: force, atomic, morita, international volume
Daten vom Verlag:
Autor/in: Seizo Morita; Franz J. Giessibl; Ernst Meyer; Roland Wiesendanger
Titel: NanoScience and Technology; Noncontact Atomic Force Microscopy - Volume 3
Verlag: Springer; Springer International Publishing
527 Seiten
Erscheinungsjahr: 2015-06-02
Cham; CH
Gedruckt / Hergestellt in Niederlande.
Sprache: Englisch
213,99 € (DE)
219,99 € (AT)
236,00 CHF (CH)
POD
XXII, 527 p. 256 illus., 159 illus. in color.
BB; Hardcover, Softcover / Physik, Astronomie/Atomphysik, Kernphysik; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Verstehen; Atom Manipulation; Atomic Force Microscopy; Atomic Resolution; Atomic/Molecular Manipulation; Chemical Structure; Force Mapping with Atomic Resolution; Liquid AFM; Magnetic Exchange Force Microscopy; Scanning Probe Techniques; Scanning Tunneling Microscopy; Nanophysics; Surfaces, Interfaces and Thin Film; Spectroscopy; Nanotechnology; Nanowissenschaften; Materialwissenschaft; Spektroskopie, Spektrochemie, Massenspektrometrie; Nanotechnologie; EA; BC
From the Contents: Introduction.- 3D Force-Field Spectroscopy.- Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts.- Spectroscopy and Manipulation Using AFM/STM at Room Temperature.- The Phantom Force - The Influence of a Tunnel Current on Force Microscopy.- Non-Contact Friction.- Magnetic Exchange Force Spectroscopy.Represents a most advanced state-of-the-art report on atomic force microscopy and scanning tunneling microscopy Deals with the various classes of materials studied at the atomic scale A valuable reference for researchers as well as a text for graduate students Written by leading researchers in the field Includes supplementary material: sn.pub/extras
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