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Noncontact Atomic Force Microscopy 03 - Seizo Morita
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Seizo Morita:

Noncontact Atomic Force Microscopy 03 - neues Buch

2009, ISBN: 9783319155883

ID: 9783319155883

Volume 3 This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology. Noncontact Atomic Force Microscopy 03: This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology. Mikroskopie Nanotechnologie Technologie / Nanotechnologie Spektroskopie SCIENCE / Nanoscience, Springer-Verlag Gmbh

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Noncontact Atomic Force Microscopy - Ernst Meyer, Franz J. Giessibl, Roland Wiesendanger, Seizo Morita
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Ernst Meyer, Franz J. Giessibl, Roland Wiesendanger, Seizo Morita:

Noncontact Atomic Force Microscopy - neues Buch

5, ISBN: 9783319155883

ID: 203179783319155883

This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force m This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology. Nanostructures, Other Sciences, Noncontact Atomic Force Microscopy~~ Ernst Meyer, Franz J. Giessibl, Roland Wiesendanger, Seizo Morita~~Nanostructures~~Other Sciences~~9783319155883, en, Noncontact Atomic Force Microscopy, Ernst Meyer, Franz J. Giessibl, Roland Wiesendanger, Seizo Morita, 9783319155883, Springer, 05/18/2015, , , , Springer, 05/18/2015

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Noncontact Atomic Force Microscopy - Volume 3 - Morita, Seizo; Giessibl, Franz J.; Meyer, Ernst; Wiesendanger, Roland
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Morita, Seizo; Giessibl, Franz J.; Meyer, Ernst; Wiesendanger, Roland:
Noncontact Atomic Force Microscopy - Volume 3 - neues Buch

2015

ISBN: 3319155881

ID: 9783319155883

In englischer Sprache. Verlag: Springer International Publishing, Introduction.- 3D Force-Field Spectroscopy.- Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts.- Spectroscopy and Manipulation Using AFM/STM at Room Temperature.- The Phantom Force - The Influence of a Tunnel Current on Force Microscopy.- Non-Contact Friction.- Magnetic Exchange Force Spectroscopy.- Revealing Subsurface Vibrational Modes by Atom-Resolved Damping Force Spectroscopy.- Interaction and Self-Assembly of Organic Molecules on Insulating Surfaces.- NC-AFM Experiments on Molecular Systems.- Single-Molecule Force Spectroscopy.- Submolecular Resolution and Tip Functionalization.- Mapping the Force-Fields of Intra- and Intermolecular Bonds.- Single-Molecule Force-Sensor Assisted Scanning Tunneling Microscopy.- Nanostructured Surfaces of Doped Alkali Halides.- The Atomic Structure of Two-Dimensional Silica.- NC-AFM Imaging of Molecules at Surfaces of Bulk Insulators.- Simulating NC-AFM of Complex Systems.- Recent Progress in Frequency Modulation Atomic Force Microscopy in Liquids.- Subnanometer-Resolution FM-AFM Imaging at Solid/Liquid Interfaces.- High Spatial-Resolution AFM Studies of Electrochemical Interfaces.- High-Speed Atomic Force Microscopic Observation of Motor Proteins. PC-PDF, 527 Seiten, XXII Seiten, 527 Seiten, [GR: 9689 - Nonbooks, PBS / Technik/Sonstiges], [SW: - Technologie, allgemein], [Ausgabe: 2015][PU:Springer International Publishing]

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Noncontact Atomic Force Microscopy - Seizo Morita; Franz J. Giessibl; Ernst Meyer; Roland Wiesendanger
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Seizo Morita; Franz J. Giessibl; Ernst Meyer; Roland Wiesendanger:
Noncontact Atomic Force Microscopy - neues Buch

ISBN: 9783319155883

ID: 9783319155883

Physics; Nanoscale Science and Technology; Surfaces and Interfaces, Thin Films; Spectroscopy and Microscopy; Nanotechnology Atom Manipulation, Atomic Force Microscopy, Atomic Resolution, Atomic/Molecular Manipulation, Chemical Structure, Force Mapping with Atomic Resolution, Liquid AFM, Magnetic Exchange Force Microscopy, Scanning Probe Techniques, Scanning Tunneling Microscopy Books eBook, Springer Science+Business Media

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Noncontact Atomic Force Microscopy - Seizo Morita;  Franz J. Giessibl;  Ernst Meyer;  Roland Wiesendanger
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Seizo Morita; Franz J. Giessibl; Ernst Meyer; Roland Wiesendanger:
Noncontact Atomic Force Microscopy - Erstausgabe

2015, ISBN: 9783319155883

ID: 32421537

Volume 3, [ED: 1], Auflage, eBook Download (PDF), eBooks, [PU: Springer-Verlag]

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Noncontact Atomic Force Microscopy 03
Autor:

Seizo Morita

Titel:

Noncontact Atomic Force Microscopy 03

ISBN-Nummer:

9783319155883

Detailangaben zum Buch - Noncontact Atomic Force Microscopy 03


EAN (ISBN-13): 9783319155883
ISBN (ISBN-10): 3319155881
Erscheinungsjahr: 2009
Herausgeber: Springer-Verlag Gmbh

Buch in der Datenbank seit 07.08.2015 14:52:55
Buch zuletzt gefunden am 01.03.2017 11:18:09
ISBN/EAN: 9783319155883

ISBN - alternative Schreibweisen:
3-319-15588-1, 978-3-319-15588-3

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