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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz & James M. Howe
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Brent Fultz & James M. Howe:

Transmission Electron Microscopy and Diffractometry of Materials - neues Buch

ISBN: 9783642297618

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… Mehr…

Nr. A1031608643. Versandkosten:Lieferzeiten außerhalb der Schweiz 3 bis 21 Werktage, , Sofort per Download lieferbar, zzgl. Versandkosten. (EUR 17.75)
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Brent Fultz#James M. Howe:

Transmission Electron Microscopy and Diffractometry of Materials - neues Buch

2012, ISBN: 9783642297618

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… Mehr…

Nr. 33784366. Versandkosten:, Sofort per Download lieferbar, DE. (EUR 0.00)
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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz; James Howe
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Brent Fultz; James Howe:
Transmission Electron Microscopy and Diffractometry of Materials - neues Buch

ISBN: 9783642297618

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… Mehr…

new in stock. Versandkosten:zzgl. Versandkosten. (EUR 0.00)
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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz; James Howe
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Brent Fultz; James Howe:
Transmission Electron Microscopy and Diffractometry of Materials - neues Buch

2013, ISBN: 9783642297618

eBooks, eBook Download (PDF), Auflage, [PU: Springer Lehrbuch], [ED: 4], Springer Lehrbuch, 2013

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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz; James M. Howe
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Brent Fultz; James M. Howe:
Transmission Electron Microscopy and Diffractometry of Materials - neues Buch

2013, ISBN: 9783642297618

eBooks, eBook Download (PDF), 4th ed. 2013, [PU: Springer Berlin], Springer Berlin, 2013

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Bibliographische Daten des bestpassenden Buches

Details zum Buch

Detailangaben zum Buch - Transmission Electron Microscopy and Diffractometry of Materials


EAN (ISBN-13): 9783642297618
ISBN (ISBN-10): 3642297617
Erscheinungsjahr: 2012
Herausgeber: Springer Lehrbuch
761 Seiten
Sprache: eng/Englisch

Buch in der Datenbank seit 2012-11-07T08:35:01+01:00 (Berlin)
Detailseite zuletzt geändert am 2023-01-10T23:14:26+01:00 (Berlin)
ISBN/EAN: 9783642297618

ISBN - alternative Schreibweisen:
3-642-29761-7, 978-3-642-29761-8
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: james, howe, jam, brent, fultz
Titel des Buches: electron microscopy materials, material, electro, transmission


Daten vom Verlag:

Autor/in: Brent Fultz; James Howe
Titel: Graduate Texts in Physics; Transmission Electron Microscopy and Diffractometry of Materials
Verlag: Springer; Springer Berlin
764 Seiten
Erscheinungsjahr: 2012-10-13
Berlin; Heidelberg; DE
Sprache: Englisch
85,59 € (DE)
88,00 € (AT)
94,50 CHF (CH)
Available
XX, 764 p.

EA; E107; eBook; Nonbooks, PBS / Chemie/Physikalische Chemie; Spektroskopie, Spektrochemie, Massenspektrometrie; Verstehen; Characterization of Materials; Dark-Field and Bright-Field Imaging; Diffraction and Imaging; Diffraction from Crystals; Imaging Lens Systems; Neutron Scattering; Small-Angle Scattering; Theory of Electron Microscopy and X-Ray Diffraction; Transmission Electron Microscopy; X-Ray Diffractometry; B; Spectroscopy; Characterization and Analytical Technique; Surfaces, Interfaces and Thin Film; Surface and Interface and Thin Film; Physics and Astronomy; Werkstoffprüfung; Materialwissenschaft; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); BC

Diffraction and X-Ray Powder Diffractometer Problems.- TEM and its Optics Problems.- Neutron Scattering Problems.- Scattering Problems.- Inelastic Electron Scattering and Spectroscopy Problems.- Diffraction from Crystals Sphere Problems.- Electron Diffraction and Crystallography Problems.- Diffraction Contrast in TEM Images Problems.- Diffraction Lineshapes Problems.- Patterson Functions and Diffuse Scattering Problems.- High-Resolution TEM Imaging Problems.- High-Resolution STEM and Related Imaging Techniques Problems.- Dynamical Theory Problems.

Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on  Transmission Electron Microscopy and Diffractometry of Materials.

 

James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.


New edition of successful, well-reviewed textbook Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry Shows how wave radiation probes the structure of materials Supports learning and teaching with numerous problems at the end of each chapter to give students practice with the concepts and practical applications Explains the mathematics needed consistently through the book Helps to extend knowledge by indicating further reading Explains concepts in detail, with no requirement for different reference materials Includes supplementary material: sn.pub/extras

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