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Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop - S.  Murti Sarma N., Vasantha Kumar Petta Veera Bala
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S. Murti Sarma N., Vasantha Kumar Petta Veera Bala:
Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop - Taschenbuch

ISBN: 3659713910

[SR: 8103667], Paperback, [EAN: 9783659713910], LAP Lambert Academic Publishing, LAP Lambert Academic Publishing, Book, [PU: LAP Lambert Academic Publishing], LAP Lambert Academic Publishing, The leakage power, power integrity challenges due to spare cells and peak IR drop respectively are addressed in this monograph. The scope of the solution proposed lies in the Physical design level near to design closure where optimization tools have tight resources to fix these challenges. However, there is a lot of scope for future work in other areas of low PM spectrum like at circuit level, architectural level, design level and software coding level. Majority of today's semiconductor designers are not moved to very recent techniques like gate array ECO flows using ECO kits provided by library vendors due to efforts involved in modifying existing flows and tight design schedules. The proposed "Optimal State Assignment" technique can help reducing spare cells leakage without affecting design flows but switching to these new techniques will help in complete leakage power reduction of spare cells. Another possible area for future investigation is to use 65nm, 45nm, 32nm and 28nm libraries for various data flow intensive architectures implementation to validate the proposed "Selective Glitch Reduction" technique., 13707, Electronics, 13718, Microelectronics, 13723, Optoelectronics, 13725, Semiconductors, 107183011, Sensors, 13727, Solid State, 227548, Transistors, 227544, Electrical & Electronics, 173515, Engineering, 173507, Engineering & Transportation, 1000, Subjects, 283155, Books

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Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop - S. Murti Sarma, N. / Vasantha Kumar, Petta Veera Bala
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S. Murti Sarma, N. / Vasantha Kumar, Petta Veera Bala:
Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop - Taschenbuch

ISBN: 3659713910

ID: 22507647989

[EAN: 9783659713910], Neubuch, Publisher/Verlag: LAP Lambert Academic Publishing | The leakage power, power integrity challenges due to spare cells and peak IR drop respectively are addressed in this monograph. The scope of the solution proposed lies in the Physical design level near to design closure where optimization tools have tight resources to fix these challenges. However, there is a lot of scope for future work in other areas of low PM spectrum like at circuit level, architectural level, design level and software coding level. Majority of today's semiconductor designers are not moved to very recent techniques like gate array ECO flows using ECO kits provided by library vendors due to efforts involved in modifying existing flows and tight design schedules. The proposed "Optimal State Assignment" technique can help reducing spare cells leakage without affecting design flows but switching to these new techniques will help in complete leakage power reduction of spare cells. Another possible area for future investigation is to use 65nm, 45nm, 32nm and 28nm libraries for various data flow intensive architectures implementation to validate the proposed "Selective Glitch Reduction" technique. | Format: Paperback | Language/Sprache: english | 116 pp

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Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop - N. S. Murti Sarma
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N. S. Murti Sarma:
Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop - Taschenbuch

2015, ISBN: 3659713910

ID: 22505007512

[EAN: 9783659713910], Neubuch, [PU: LAP Lambert Academic Publishing Jun 2015], Neuware - The leakage power, power integrity challenges due to spare cells and peak IR drop respectively are addressed in this monograph. The scope of the solution proposed lies in the Physical design level near to design closure where optimization tools have tight resources to fix these challenges. However, there is a lot of scope for future work in other areas of low PM spectrum like at circuit level, architectural level, design level and software coding level. Majority of today's semiconductor designers are not moved to very recent techniques like gate array ECO flows using ECO kits provided by library vendors due to efforts involved in modifying existing flows and tight design schedules. The proposed 'Optimal State Assignment' technique can help reducing spare cells leakage without affecting design flows but switching to these new techniques will help in complete leakage power reduction of spare cells. Another possible area for future investigation is to use 65nm, 45nm, 32nm and 28nm libraries for various data flow intensive architectures implementation to validate the proposed 'Selective Glitch Reduction' technique. 116 pp. Englisch

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Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop - N. S. Murti Sarma, Petta Veera Bala Vasantha Kumar
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N. S. Murti Sarma, Petta Veera Bala Vasantha Kumar:
Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop - Taschenbuch

ISBN: 3659713910

Taschenbuch, [EAN: 9783659713910], Lap Lambert Academic Publishing, Lap Lambert Academic Publishing, Book, [PU: Lap Lambert Academic Publishing], Lap Lambert Academic Publishing, 60525011, Elektronik, 60516011, Elektrotechnik, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 56441011, Technologie, 56447011, Erneuerbare Energien, 56448011, Innovationen, 1320311031, Nachschlagewerke, 56444011, Nanotechnologie, 56449011, Philosophie der Technologie, 56445011, Risiken, 56446011, Sicherheit & Gesundheit, 273011011, Soziale Aspekte, 54518011, Technisches Denken & Schreiben, 56451011, Technologie & Gesellschaft, 56211011, Technologiegeschichte, 56442011, Zukunftsforschung, 56047011, Wissenschaft, 54071011, Genres, 52044011, Fremdsprachige Bücher

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Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop - S. Murti Sarma, N.; Vasantha Kumar, Petta Veera Bala
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Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop

The leakage power, power integrity challenges due to spare cells and peak IR drop respectively are addressed in this monograph. The scope of the solution proposed lies in the Physical design level near to design closure where optimization tools have tight resources to fix these challenges. However, there is a lot of scope for future work in other areas of low PM spectrum like at circuit level, architectural level, design level and software coding level. Majority of today's semiconductor designers are not moved to very recent techniques like gate array ECO flows using ECO kits provided by library vendors due to efforts involved in modifying existing flows and tight design schedules. The proposed "Optimal State Assignment" technique can help reducing spare cells leakage without affecting design flows but switching to these new techniques will help in complete leakage power reduction of spare cells. Another possible area for future investigation is to use 65nm, 45nm, 32nm and 28nm libraries for various data flow intensive architectures implementation to validate the proposed "Selective Glitch Reduction" technique.

Detailangaben zum Buch - Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop


EAN (ISBN-13): 9783659713910
ISBN (ISBN-10): 3659713910
Gebundene Ausgabe
Taschenbuch
Erscheinungsjahr: 2015
Herausgeber: OmniScriptum GmbH & Co. KG

Buch in der Datenbank seit 14.07.2015 13:04:29
Buch zuletzt gefunden am 27.11.2017 11:43:39
ISBN/EAN: 9783659713910

ISBN - alternative Schreibweisen:
3-659-71391-0, 978-3-659-71391-0


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